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Machine-learning Spectral Indicators of Topology

Oct 1, 2022
The data structure (upper) and the main results (lower) of the model performance classifying topology from X-ray absorption spectroscopy.
The data structure (upper) and the main results (lower) of the model performance classifying topology from X-ray absorption spectroscopy.

Topological materials are promising for next-generation energy  and  information  applications.  However,  the experimental   determination   of   topology   can   be painstaking, with a few limitations such as limited sample types,  high  technical  barriers,  and  limited  sample environment.
In  this  work,  by  designing  a  machine  learning architecture  to  analyze  simple  X-ray  absorption  spectra, materials’ topological class can be determined with over 90% accuracy. This enables the topological determination of new topological materials with much reduced technical barriers  in  broader  types  of  material  candidates,  and facilitates  study  of  other  phenomena  like  topological phase transition and amorphous topological materials.

Authors

Mingda Li, Massachusetts Institute of Technology

Additional Materials

U.S. National Science Foundation and NSF DMREF, Materials for Our Future

This material is based upon work supported by the U.S. National Science Foundation Award No. 2015237. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the U.S. National Science Foundation. This site is maintained collaboratively by principal investigators with NSF DMREF awards, independent of the NSF.